Selecting suitable image dimensions for scanning probe microscopy

Bowen, James and Cheneler, David (2017). Selecting suitable image dimensions for scanning probe microscopy. Surfaces and Interfaces, 9 pp. 132–142.

DOI: https://doi.org/10.1016/j.surfin.2017.09.003

Abstract

The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.

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About

• Item ORO ID
• 50919
• Item Type
• Journal Item
• ISSN
• 2468-0230
• Project Funding Details

• Funded Project Name	Project ID	Funding Body
  Not Set	Not Set	European Regional Development Fund (ERDF)

• Keywords
• Atomic force microscopy; roughness; scanning probe microscopy; surface; topography
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Research Group
• Smart Materials
• Copyright Holders
• © 2017 Elsevier
• Depositing User
• James Bowen