The Open UniversitySkip to content
 

Selecting suitable image dimensions for scanning probe microscopy

Bowen, James and Cheneler, David (2017). Selecting suitable image dimensions for scanning probe microscopy. Surfaces and Interfaces (Early Access).

Full text available as:
Full text not publicly available
Due to copyright restrictions, this file is not available for public download until 10 September 2018
Click here to request a copy from the OU Author.
DOI (Digital Object Identifier) Link: https://doi.org/10.1016/j.surfin.2017.09.003
Google Scholar: Look up in Google Scholar

Abstract

The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the features being analysed, and there is often a trade-off between image quality and acquisition time. This work investigates a commonly encountered problem in nanometrology - how to choose a scan size which is representative of the entire sample. The topographies of a variety of samples are investigated, including metals, polymers, and thin films.

Item Type: Journal Item
Copyright Holders: 2017 Elsevier
ISSN: 2468-0230
Project Funding Details:
Funded Project NameProject IDFunding Body
Not SetNot SetEuropean Regional Development Fund (ERDF)
Keywords: Atomic force microscopy; roughness; scanning probe microscopy; surface; topography
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 50919
Depositing User: James Bowen
Date Deposited: 13 Sep 2017 15:13
Last Modified: 21 Sep 2017 14:01
URI: http://oro.open.ac.uk/id/eprint/50919
Share this page:

Altmetrics

Actions (login may be required)

Policies | Disclaimer

© The Open University   + 44 (0)870 333 4340   general-enquiries@open.ac.uk