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Comparing simulations and test data of a radiation damaged charge-coupled device for the Euclid mission

Skottfelt, Jesper; Hall, David J.; Gow, Jason P. D.; Murray, Neil J.; Holland, Andrew D. and Prod’homme, Thibaut (2017). Comparing simulations and test data of a radiation damaged charge-coupled device for the Euclid mission. Journal of Astronomical Telescopes, Instruments, and Systems, 3(2), article no. 028001.

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The visible imager instrument on board the Euclid mission is a weak-lensing experiment that depends on very precise shape measurements of distant galaxies obtained by a large charge-coupled device (CCD) array. Due to the harsh radiative environment outside the Earth’s atmosphere, it is anticipated that the CCDs over the mission lifetime will be degraded to an extent that these measurements will be possible only through the correction of radiation damage effects. We have therefore created a Monte Carlo model that simulates the physical processes taking place when transferring signals through a radiation-damaged CCD. The software is based on Shockley–Read–Hall theory and is made to mimic the physical properties in the CCD as closely as possible. The code runs on a single electrode level and takes the three-dimensional trap position, potential structure of the pixel, and multilevel clocking into account. A key element of the model is that it also takes device specific simulations of electron density as a direct input, thereby avoiding making any analytical assumptions about the size and density of the charge cloud. This paper illustrates how test data and simulated data can be compared in order to further our understanding of the positions and properties of the individual radiation-induced traps.

Item Type: Journal Item
Copyright Holders: 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
ISSN: 2329-4124
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 49146
Depositing User: Jesper Skottfelt
Date Deposited: 11 Apr 2017 08:50
Last Modified: 02 May 2019 20:08
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