Theoretical total ionization cross sections of CHx, CFx SiHx SiFx (x =1 – 4) and CCl4 targets by electron impact

Joshipura, K.N.; Vinodkumar, M.; Antony, B.K. and Mason, N.J. (2003). Theoretical total ionization cross sections of CHx, CFx SiHx SiFx (x =1 – 4) and CCl4 targets by electron impact. European Physical Journal D - Atomic, Molecular and Optical Physics, 23(1) pp. 81–90.

DOI: https://doi.org/10.1140/epjd/e2003-00009-9

Abstract

Total ionization cross-sections of electron impact are calculated for the molecular targets CHx, CFx, SiHx, SiFx (x = 1-4) and CCl4 at incident energies 20-3 000 eV. The calculation is based on Complex Scattering Potential approach, as developed by us recently. This leads to total inelastic cross-sections, from which the total ionization cross-sections are extracted by reasonable physical arguments. Extensive comparisons are made here with the previous theoretical and experimental data. The present results are satisfactory except for the CFx and SiFx (x = 1-3) radicals, for which the experimental data are lower than most of the theories by more than 50%.

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• Item ORO ID
• 4729
• Item Type
• Journal Item
• ISSN
• 1434-6060
• Extra Information
• Some of the symbols may not have transferred correctly into this bibliographic record.
• Keywords
• atomic excitation; ionization; electron impact
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Research Group
• Physics
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• Users 6041 not found.