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Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing

Gow, J.P.D.; Murray, N.J.; Wood, D.; Burt, D.; Hall, D.J.; Dryer, B. and Holland, A.D. (2016). Charge transfer efficiency in a p-channel CCD irradiated cryogenically and the impact of room temperature annealing. In: High Energy, Optical, and Infrared Detectors for Astronomy VII, 99150L.

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It is important to understand the impact of the space radiation environment on detector performance, thereby ensuring that the optimal operating conditions are selected for use in flight. The best way to achieve this is by irradiating the device using appropriate mission operating conditions, i.e. holding the device at mission operating temperature with the device powered and clocking. This paper describes the Charge Transfer Efficiency (CTE) measurements made using an e2v technologies p-channel CCD204 irradiated using protons to the 10 MeV equivalent fluence of 1.24×109 at 153 K. The device was held at 153 K for a period of 7 days after the irradiation before being allowed up to room temperature where it was held at rest, i.e. unbiased, for twenty six hours to anneal before being cooled back to 153 K for further testing, this was followed by a further one week and three weeks of room temperature annealing each separated by further testing. A comparison to results from a previous room temperature irradiation of an n-channel CCD204 is made using assumptions of a factor of two worse CTE when irradiated under cryogenic conditions which indicate that p-channel CCDs offer improved tolerance to radiation damage when irradiated under cryogenic conditions.

Item Type: Conference or Workshop Item
Copyright Holders: 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
ISSN: 0277-786X
Keywords: CCD; p-channel; cryogenic irradiation; charge transfer efficiency; proton radiation damage
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 47005
Depositing User: Jason Gow
Date Deposited: 12 Aug 2016 14:50
Last Modified: 02 May 2019 15:46
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