Dione: An Integrated Measurement and Defect Prediction Solution

Caglayan, Bora; Tosun Misirli, Ayse; Calikli, Gul; Aytac, Turgay; Bener, Ayse and Turhan, Burak (2012). Dione: An Integrated Measurement and Defect Prediction Solution. In: 20th International Symposium on the Foundations of Software Engineering (ACM SIGSOFT 2012 FSE-20), 11-16 Nov 2012, Cary, North Carolina, USA.

DOI: https://doi.org/10.1145/2393596.2393619

Abstract

We present an integrated measurement and defect prediction tool: Dione. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of Dione followed by an overview of our demonstration.

Viewing alternatives

Metrics

Item Actions

Export

You can export this page using these formats Digital Object Identifier - DOI

About

• Item ORO ID
• 45351
• Item Type
• Conference or Workshop Item
• Keywords
• software tool; measurement; software defect prediction
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Computing and Communications
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Related URLs
• • http://www.sigsoft.org/fse20/
• Depositing User
• Gul Calikli