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Upton, P. J.
(2002).
DOI: https://doi.org/10.1023/A:1013965806342
Abstract
We use exact methods to derive an interface model from an underlying microscopic model, i.e., the Ising model on a square lattice. At the wetting transition in the two-dimensional Ising model, the long Peierls contour (or interface) gets depinned from the substrate. Using exact transfer-matrix methods, we find that on sufficiently large length scales (i.e., length scales sufficiently larger than the bulk correlation length) the distribution of the long contour is given by a unique probability measure corresponding to a continuous ``interface model". The interface binding ``potential" is a Dirac delta function with support on the substrate and, therefore, a distribution rather than a function. More precisely, critical wetting in the two-dimensional Ising model, viewed on length scales sufficiently larger than the bulk correlation length, is described by a reflected Brownian motion with a Dirac δ perturbation on the substrate so that exactly at the wetting transition the substrate is a perfectly reflecting surface, otherwise there exists a δ perturbation. A lattice solid-on-solid model was found to give identical results (albeit with modified parameters) on length scales sufficiently larger than the lattice spacing, thus demonstrating the universality of the continuous interface model.
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About
- Item ORO ID
- 4495
- Item Type
- Journal Item
- ISSN
- 0195-928X
- Extra Information
- The original publication is available at www.springerlink.com
- Keywords
- critical wetting; exact results; interface models; Ising models; solid-on-solid models.
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Mathematics and Statistics
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Copyright Holders
- © 2002 Plenum Publishing Corporation
- Related URLs
- Depositing User
- Paul Upton