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Low energy electron attachment to formic acid

Pelc, A.; Sailer, W.; Scheier, P.; Mason, N.J. and Märk, T.D. (2002). Low energy electron attachment to formic acid. European Physical Journal D - Atomic, Molecular and Optical Physics, 20(3) pp. 441–444.

DOI (Digital Object Identifier) Link: http://dx.doi.org/10.1140/epjd/e2002-00140-1
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Abstract

Using a high resolution electron energy monochromator low energy electron attachment to formic acid is studied for the first time by means of mass spectrometric detection of the product anions. The largest dissociative electron attachment (DA) cross-section produces HCOO-+H with weaker channels for OH- and O- becoming apparent at higher incident energies.

Item Type: Journal Article
ISSN: 1434-6060
Academic Unit/Department: Science > Physical Sciences
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 4482
Depositing User: Users 6827 not found.
Date Deposited: 06 Jul 2006
Last Modified: 24 Nov 2014 12:02
URI: http://oro.open.ac.uk/id/eprint/4482
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