Pelc, A.; Sailer, W.; Scheier, P.; Mason, N.J.; Illenberger, E. and Märk, T.D.
|DOI (Digital Object Identifier) Link:||http://doi.org/10.1016/S0042-207X(02)00682-6|
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Low energy (from 0 up to 13 eV) electron attachment to formic and acetic acid is studied for the first time by means of mass spectrometric detection of the product anions. The energy spread of electron beam was 120 meV (acetic acid) and 140 meV in the case of formic acid. For all negative fragments estimates for the absolute partial cross sections were obtained. In the case of both acids, the (parent—H)− ion yield shows a structure that is tentatively ascribed to the vibrational excitation in the formate anion.
|Item Type:||Journal Article|
|Keywords:||dissociative electron attachment; organic acid; mass spectrometry|
|Academic Unit/Department:||Science > Physical Sciences
|Interdisciplinary Research Centre:||Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)|
|Depositing User:||Users 6827 not found.|
|Date Deposited:||06 Jul 2006|
|Last Modified:||14 Jan 2016 16:02|
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