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Electron attachment to simple organic acids

Pelc, A.; Sailer, W.; Scheier, P.; Mason, N.J.; Illenberger, E. and Märk, T.D. (2003). Electron attachment to simple organic acids. Vacuum, 70(2-3) pp. 429–433.

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Low energy (from 0 up to 13 eV) electron attachment to formic and acetic acid is studied for the first time by means of mass spectrometric detection of the product anions. The energy spread of electron beam was 120 meV (acetic acid) and 140 meV in the case of formic acid. For all negative fragments estimates for the absolute partial cross sections were obtained. In the case of both acids, the (parent—H)− ion yield shows a structure that is tentatively ascribed to the vibrational excitation in the formate anion.

Item Type: Journal Item
ISSN: 0042-207X
Keywords: dissociative electron attachment; organic acid; mass spectrometry
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Physics
Item ID: 4477
Depositing User: Users 6827 not found.
Date Deposited: 06 Jul 2006
Last Modified: 07 Dec 2018 08:56
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