The Open UniversitySkip to content

A CMOS TDI image sensor for Earth observation

Rushton, Joseph E.; Stefanov, Konstantin D.; Holland, Andrew D.; Endicott, James; Mayer, Frederic and Barbier, Frederic (2015). A CMOS TDI image sensor for Earth observation. In: Proceedings of SPIE, SPIE, 9616.

Full text available as:
PDF (Accepted Manuscript) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
Download (2MB) | Preview
DOI (Digital Object Identifier) Link:
Google Scholar: Look up in Google Scholar


Time Delay and Integration (TDI) is used to increase the Signal to Noise Ratio (SNR) in image sensors when imaging fast moving objects. One important TDI application is in Earth observation from space. In order to operate in the space radiation environment, the effect that radiation damage has on the performance of the image sensors must be understood. This work looks at prototype TDI sensor pixel designs, produced by e2v technologies. The sensor is a CCD-like charge transfer device, allowing in-pixel charge summation, produced on a CMOS process. The use of a CMOS process allows potential advantages such as lower power consumption, smaller pixels, higher line rate and extra on-chip functionality which can simplify system design. CMOS also allows a dedicated output amplifier per column allowing fewer charge transfers and helping to facilitate higher line rates than CCDs. In this work the effect on the pixels of radiation damage from high energy protons, at doses relevant to a low Earth orbit mission, is presented. This includes the resulting changes in Charge Transfer inefficiency (CTI) and dark signal.

Item Type: Conference or Workshop Item
Copyright Holders: 2015 Society of Photo-Optical Instrumentation Engineers (SPIE).
ISSN: 1996-756X
Keywords: image sensors; radiation; sensors; signal to noise ratio; orbital dynamics; amplifiers; charge-coupled devices
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Related URLs:
Item ID: 44326
Depositing User: Joseph Rushton
Date Deposited: 06 Oct 2015 08:28
Last Modified: 07 Dec 2018 11:45
Share this page:


Altmetrics from Altmetric

Citations from Dimensions

Download history for this item

These details should be considered as only a guide to the number of downloads performed manually. Algorithmic methods have been applied in an attempt to remove automated downloads from the displayed statistics but no guarantee can be made as to the accuracy of the figures.

Actions (login may be required)

Policies | Disclaimer

© The Open University   contact the OU