Dissociation pathways in low energy (0–2 eV) electron attachment to Cl2O

Sailer, Wolfgang; Tegeder, Petra; Probst, Michael; Drexel, Herwig; Grill, Verena; Scheier, Paul; Mason, Nigel J.; Illenberger, Eugen and Mark, Tilmann D. (2001). Dissociation pathways in low energy (0–2 eV) electron attachment to Cl2O. Chemical Physics Letters, 344(5-6) pp. 471–478.

DOI: https://doi.org/10.1016/S0009-2614(01)00814-4

Abstract

Dissociative electron attachment (DA) to ClOCl is studied in a high resolution crossed beam experiment. Two complementary ion pairs, Cl/ClO and O/Cl2, are observed. The Cl/ClO pair arises from a simple Cl–OCl bond cleavage with the electron sitting on either of the two fragments. The O/Cl2 pair is formed by a concerted reaction with the expulsion of O (or O) and formation of Cl2 (or Cl2). Ab initio calculations indicate that in low energy electron attachment an electronically excited state of the precursor anion (ClOCl* (2B2)) is involved.

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