Optimisation of nanoscale surface topography analysis

Bowen, James and Cheneler, David (2012). Optimisation of nanoscale surface topography analysis. In: RSC Postgraduate Symposium on Nanotechnology, 14 Dec 2012, Birmingham, UK.

URL: https://www.academia.edu/9846046/Optimisation_of_n...

Abstract

The objective of this research was to answer the question “Does there exist an optimal range of analysis conditions for the measurement of nanoscale surface roughness?” Characterisation of the surface topography of a selection of polished, machined, deposited and cast materials over a range of length scales was performed using atomic force microscopy. The average roughness, Ra, was calculated for each image.

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About

• Item ORO ID
• 43402
• Item Type
• Conference or Workshop Item
• Keywords
• materials engineering; materials science; surface science; atomic force microscopy; surface topography
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Copyright Holders
• © 2012 The Authors
• Depositing User
• James Bowen