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Optimisation of nanoscale surface topography analysis

Bowen, James and Cheneler, David (2012). Optimisation of nanoscale surface topography analysis. In: RSC Postgraduate Symposium on Nanotechnology, 14 December 2012, Birmingham, UK.

URL: https://www.academia.edu/9846046/Optimisation_of_n...
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Abstract

The objective of this research was to answer the question “Does there exist an optimal range of analysis conditions for the measurement of nanoscale surface roughness?” Characterisation of the surface topography of a selection of polished, machined, deposited and cast materials over a range of length scales was performed using atomic force microscopy. The average roughness, Ra, was calculated for each image.

Item Type: Conference or Workshop Item
Copyright Holders: 2012 The Authors
Keywords: materials engineering; materials science; surface science; atomic force microscopy; surface topography
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 43402
Depositing User: James Bowen
Date Deposited: 09 Jun 2015 09:34
Last Modified: 10 Nov 2016 17:18
URI: http://oro.open.ac.uk/id/eprint/43402
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