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Bowen, James; Manickam, Mayandithevar; Iqbal, Parvez; Evans, Stephen D.; Critchley, Kevin; Preece, Jon A. and Kendall, Kevin
(2009).
DOI: https://doi.org/10.1016/j.tsf.2009.01.093
Abstract
The atomic force microscopy (AFM) adhesion force behaviour and contact angle titration behaviour of self-assembled monolayers (SAMs) presenting surface pyridine and substituted pyridine moieties has been investigated as a function of pH and electrolyte concentration. The pKas of the pyridine moieties were modified through the incorporation of fluorine, chlorine and bromine substituents in the pyridyl ring. Contact angle titration and AFM adhesion force measurements were performed using aqueous phosphate buffered saline solutions over the pH range 3–9, and at concentrations of 150 mM and 0.1 mM. AFM adhesion force measurements were performed using a clean Si3N4 pyramidal-tipped AFM cantilever.
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About
- Item ORO ID
- 43196
- Item Type
- Journal Item
- ISSN
- 0040-6090
- Keywords
- self-assembled monolayer; adhesion; surface chemistry; pyridine; gold; atomic force microscopy
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Copyright Holders
- © 2009 Elsevier B.V
- Related URLs
- Depositing User
- James Bowen