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On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination

Bowen, James; Cheneler, David; Walliman, Dominic; Arkless, Stuart G; Zhang, Zhibing; Ward, Michael C. L. and Adams, Michael J. (2010). On the calibration of rectangular atomic force microscope cantilevers modified by particle attachment and lamination. Measurement Science and Technology, 21(11), article no. 115106.

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DOI (Digital Object Identifier) Link: https://doi.org/10.1088/0957-0233/21/11/115106
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Abstract

A simple but effective method for estimating the spring constant of commercially available atomic force microscope (AFM) cantilevers is presented, based on estimating the cantilever thickness from knowledge of its length, width, resonant frequency and the presence or absence of an added mass, such as a colloid probe at the cantilever apex, or a thin film of deposited material. The spring constant of the cantilever can then be estimated using standard equations for cantilever beams. The results are compared to spring constant calibration measurements performed using reference cantilevers. Additionally, the effect of the deposition of Cr and Ti thin films onto rectangular Si cantilevers is investigated.

Item Type: Journal Item
Copyright Holders: 2010 IOP Publishing Ltd
ISSN: 1361-6501
Extra Information: 9 pp.
Keywords: atomic force microscopy; cantilever; calibration; spring constant; resonant frequency; thin film; vacuum evaporation; gold; chromium; titanium; x-ray photoelectron; spectroscopy
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 43189
Depositing User: James Bowen
Date Deposited: 15 Jun 2015 10:39
Last Modified: 13 Nov 2016 19:57
URI: http://oro.open.ac.uk/id/eprint/43189
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