Effects of current on early stages of focused ion beam nano-machining

Sabouri, Aydin; Anthony, Carl J.; Prewett, Philip D.; Bowen, James and Butt, Haider (2015). Effects of current on early stages of focused ion beam nano-machining. Materials Research Express, 2(5)

DOI: https://doi.org/10.1088/2053-1591/2/5/055005

Abstract

In this report we investigate the effects of focused ion beam machining at low doses in the range of 10¹⁵–10¹⁶ ions cm^-2 for currents below 300 pA on Si(100) substrates. The effects of similar doses with currents in the range 10–300 pA were compared. The topography of resulting structures has been characterized using atomic force microscope, while crystallinity of the Si was assessed by means of Raman spectroscopy. These machining parameters allow a controllable preparation of structures either protruding from, or recessed into, the surface with nanometre precision.

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About

• Item ORO ID
• 42774
• Item Type
• Journal Item
• ISSN
• 2053-1591
• Extra Information
• 8 pp.
• Keywords
• focused ion beam; atomic force microscopy; Raman spectroscopy
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Copyright Holders
• © 2015 IOP Publishing Ltd
• Depositing User
• James Bowen