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Total ionizing dose effects on I-V and noise characteristics of MOS transistors in a 0.18 μm CMOS Image Sensor process

Greig, Thomas; Stefanov, Konstantin; Holland, Andrew; Clarke, Andrew; Burt, David and Gow, Jason (2013). Total ionizing dose effects on I-V and noise characteristics of MOS transistors in a 0.18 μm CMOS Image Sensor process. In: 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

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DOI (Digital Object Identifier) Link: https://doi.org/10.1109/RADECS.2013.6937391
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Abstract

This paper presents an investigation into total ionizing dose (TID) effects on I-V and noise characteristics of MOS transistors manufactured in a 0.18 µm CMOS Image Sensor (CIS) process. The CIS are intended for use in space science missions experiencing harsh radiation environments, such as ESA’s forthcoming JUICE mission. Devices were therefore irradiated to various TID levels up to 1 Mrad. Following irradiation, significant leakage current and threshold voltage modification was observed, and this was found to be more severe for devices with small channel geometries. Noise spectral density measurements were also performed at the different irradiation steps. Noise in the smaller geometry devices was found to increase following irradiation, whereas for larger devices it was not significantly affected. These findings enable future assessment of the effects of TID on functional and electro-optical characteristics of high performance CIS designs for use in space.

Item Type: Conference or Workshop Item
Copyright Holders: 2013 IEEE
ISBN: 1-4673-5057-5, 978-1-4673-5057-0
Project Funding Details:
Funded Project NameProject IDFunding Body
Not SetNot SetUKSA
Not SetNot Sete2v
Not SetNot SetOpen University
Keywords: CMOS image sensor (CIS); metal oxide semiconductor (MOS) transistor; total ionizing dose (TID)
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Space
Item ID: 42332
Depositing User: Jason Gow
Date Deposited: 17 Mar 2015 11:35
Last Modified: 08 Dec 2018 14:01
URI: http://oro.open.ac.uk/id/eprint/42332
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