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Assessment of the performance and radiation damage effects under cryogenic temperatures of a P-channel CCD204s

Murray, Neil J.; Holland, Andrew D.; Gow, Jason P. D.; Hall, David J.; Stefanov, Konstantin D.; Dryer, Ben J.; Barber, Simeon and Burt, David J. (2014). Assessment of the performance and radiation damage effects under cryogenic temperatures of a P-channel CCD204s. In: High Energy, Optical, and Infrared Detectors for Astronomy VI.

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CCDs continue to be the detector of choice for high resolution and high performance space applications. One perceived drawback is their susceptibility to radiation damage, in particular the formation of trap sites leading to a decrease in charge transfer efficiency. To that end, ESA has started a programme to investigate a new generation of devices based upon p-channel technology. The expectation is that once mature, p-channel devices may offer a significant increase in tolerance to proton radiation over traditional n-type buried channel CCDs. Early studies of e2v devices to assess the radiation hardness of p-channel devices were limited by the quality of devices available, however more recently, good quality p-channel CCD204s have been manufactured and studied. A more detailed evaluation of p-channel CCDs is now underway to realise the full potential of the technology for use in future high radiation environment space missions. A key aspect is the development of a cryogenic test rig that will allow for the first time a direct comparison of the radiation damage effects when the irradiation is performed both traditionally unbiased at room temperature and cryogenically with the device operational. Subsequent characterisations will also be performed on the cryogenic device after periods of storage at room temperature to investigate the potential annealing effects upon the lattice damage. Here we describe and present early results from an extensive programme of testing which will address all key performance parameters for p-channel CCDs, such as full electro-optical characterisation, assessment of radiation hardness and investigation of trap species.

Item Type: Conference or Workshop Item
Copyright Holders: 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
ISSN: 0277-786X
Keywords: charge-coupled devices; data storage; sensors; annealing
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 40942
Depositing User: David Hall
Date Deposited: 23 Sep 2014 09:15
Last Modified: 21 May 2019 01:44
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