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Proton damage comparison of an e2v technologies n-channel and p-channel CCD204

Gow, Jason; Murray, Neil; Holland, Andrew and Burt, David (2014). Proton damage comparison of an e2v technologies n-channel and p-channel CCD204. IEEE Transactions on Nuclear Science, 61(4) pp. 1843–1848.

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DOI (Digital Object Identifier) Link: https://doi.org/10.1109/TNS.2014.2298254
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Abstract

Comparisons have been made of the relative degradation of charge transfer efficiency in n-channel and p-channel CCDs subjected to proton irradiation. The comparison described in this paper was made using e2v technologies plc. CCD204 devices fabricated using the same mask set. The device performance was compared over a range of temperatures using the same experimental arrangement and technique to provide a like-for-like comparison. The parallel transfer using the p-channel CCD was then optimized using a trap pumping technique to identify the optimal operating conditions at 153 K.

Item Type: Journal Item
Copyright Holders: 2014 IEEE
ISSN: 0018-9499
Keywords: CCD; charge transfer inefficiency; p-channel; pocket/trap pumping; proton radiation damage
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
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Item ID: 39754
Depositing User: Jason Gow
Date Deposited: 21 Mar 2014 09:22
Last Modified: 08 Dec 2018 11:59
URI: http://oro.open.ac.uk/id/eprint/39754
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