Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II

Jenner, Frances E.; Holden, Peter; Mavrogenes, John A.; O'Neill, Hugh St.C. and Allen, Charlotte (2009). Determination of selenium concentrations in NIST SRM 610, 612, 614 and geological glass reference materials using the electron probe, LA-ICP-MS and SHRIMP II. Geostandards and Geoanalytical Research, 33(3) pp. 309–317.

DOI: https://doi.org/10.1111/j.1751-908X.2009.00024.x

Abstract

A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g−1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g−1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g−1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g−1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g−1.

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