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Defect studies of ZnO films prepared by pulsed laser deposition on various substrates

Melikhova, O.; Čižek, J.; Procházka, I.; Kužel, R.; Novotny, M.; Bulíř, J.; Lančok, J.; Anwand, W.; Brauer, G.; Connolly, J.; McCarthy, E.; Krishnamurthy, S. and Mosnier, J.-P. (2013). Defect studies of ZnO films prepared by pulsed laser deposition on various substrates. Journal of Physics: Conference Series, 443, article no. 012018.

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ZnO thin films deposited on various substrates were characterized by slow positron implantation spectroscopy (SPIS) combined with X-ray diffraction (XRD). All films studied exhibit wurtzite structure and crystallite size 20-100 nm. The mosaic spread of crystallites is relatively small for the films grown on single crystalline substrates while it is substantial for the film grown on amorphous substrate. SPIS investigations revealed that ZnO films deposited on single crystalline substrates exhibit significantly higher density of defects than the film deposited on amorphous substrate. This is most probably due to a higher density of misfit dislocations, which compensate for the lattice mismatch between the film and the substrate.

Item Type: Journal Item
Copyright Holders: IOP publishing
ISSN: 1742-6596
Project Funding Details:
Funded Project NameProject IDFunding Body
Not SetP108/11/0958Czech Science Agency
Not SetMEB101102Czech Ministry of Education, Youths and Sports
Not Set50755628DAAD
Extra Information: 16th International Conference on Positron Annihilation (ICPA-16) 19–24 August 2012, H H Wills Physics Laboratory, University of Bristol, UK
Keywords: ZnO; PLD; XRD; Doppler broadening; fused silica; defects
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 37869
Depositing User: Satheesh Krishnamurthy
Date Deposited: 02 Jul 2013 14:40
Last Modified: 07 Dec 2018 19:40
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