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The effect of protons on the performance of second generation Swept Charge Devices

Gow, Jason P. D.; Holland, Andrew D.; Pool, Peter J. and Smith, David R. (2012). The effect of protons on the performance of second generation Swept Charge Devices. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 680 pp. 86–89.

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The e2v technologies Swept Charge Device (SCD) was developed as a large area detector for X-ray Florescence (XRF) analysis, achieving near Fano-limited spectroscopy at -15 °C. The SCD was flown in the XRF instruments on board the European Space Agency's SMART-1 and the Indian Space Research Organisation's Chandrayaan-1 lunar missions. The second generation SCD, proposed for use in the soft X-ray spectrometer on the Chandrayaan-2 lunar orbiter and the soft X-ray imager on China's HXMT mission, was developed, in part, using the findings of the radiation damage studies performed for the Chandrayaan-1 X-ray Spectrometer. This paper discusses the factor of two improvement in radiation tolerance achieved in the second generation SCD, the different SCD sizes produced and their advantages for future XRF instruments, for example through reduced shielding mass or higher operating temperatures.

Item Type: Journal Item
Copyright Holders: 2012 Elsevier B.V.
ISSN: 0168-9002
Keywords: Swept Charge Device; CCD; proton radiation effects; X-ray fluorescence
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 33746
Depositing User: Jason Gow
Date Deposited: 30 May 2012 15:17
Last Modified: 08 Dec 2018 14:05
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