Greig, Tom; Castelli, Chris; Holland, Andrew and Burt, David
The design of an active pixel sensor test structure optimised for the read out of scintillator screens.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 573(1-2) pp. 30–33.
Indirect detection of X-rays using a scintillator coupled to a Solid-state sensor is an application where the CMOS Active Pixel Sensor (APS) can offer improved performance compared with conventional charge coupled device (CCD) based systems. The main advantages that CMOS sensors offer are reduced susceptibility to radiation damage, lower power consumption and increased on chip functionality. We describe the operation of a basic photodiode type pixel and explain how the read-out and sensing arrangement can be optimised for indirect X-ray detection in digital radiography applications. The optimised pixel is designed to have a narrow-band response to visible light generated by a scintillator screen, while at the same time suppressing signal from direct X-ray interaction. We outline a programme that has recently begun at Brunel University and e2v technologies to design, fabricate, and characterise variants of these pixel structures to perform a parametric study of CMOS imager performance.
||2006 Elsevier B.V.
|External Project Funding Details:
|Funded Project Name||Project ID||Funding Body|
|Not Set||Not Set||Brunel University|
|Not Set||Not Set||e2v technologies|
|Not Set||Not Set||Engineering and Physical Sciences Research Council (EPSRC)|
||CMOS APS; X-ray Imaging; readout electronics; photodiode
||Science > Physical Sciences
|Interdisciplinary Research Centre:
||Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
||11 Jan 2012 15:37
||21 Aug 2013 13:37
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