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Improving the spatial resolution of a soft X-ray Charge Coupled Device used for Resonant Inelastic X-ray Scattering

Soman, M. R.; Hall, D. J.; Tutt, J. H.; Murray, N. J.; Holland, A. D.; Schmitt, T.; Raabe, J. and Schmitt, B. (2011). Improving the spatial resolution of a soft X-ray Charge Coupled Device used for Resonant Inelastic X-ray Scattering. Journal of Instrumentation, 6(11) C11021.

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The Super Advanced X-ray Emission Spectrometer (SAXES) at the Advanced Resonant Scattering (ADRESS) beamline of the Swiss Light Source is a high-resolution X-ray spectrometer used as an end station for Resonant Inelastic X-ray Scattering from 400 eV to 1600 eV. Through the dispersion of photons across a CCD, the energy of scattered photons may be determined by their detected spatial position. The limiting factor of the energy resolution is currently the spatial resolution achieved with the CCD, reported at 24 μm FWHM.

For this energy range the electron clouds are formed by interactions in the `field free' region of the back-illuminated CCD. These clouds diffuse in all directions whilst being attracted to the electrodes, leading to events that are made up of signals in multiple pixels. The spreading of the charge allows centroiding techniques to be used to improve the CCD spatial resolution and therefore improve the energy resolution of SAXES.

The PolLux microscopy beamline at the SLS produces an X-ray beam with a diameter of 20 nm. The images produced from scanning the narrow beam across CCD pixels (13.5 x 13.5 μm2 ) can aid in the production of event recognition algorithms, allowing the matching of event profiles to photon interactions in a specific region of a pixel. Through the use of this information software analysis can be refined with the aim of improving the energy resolution.

Item Type: Journal Item
Copyright Holders: 2011 IOP Publishing Ltd and SISSA
Extra Information: Part of 13th International Workshop on Radiation Imaging Detectors (IWORID), 3–7 July 2011, Eth Zurich, Switzerland
Keywords: data processing methods; solid state detectors; X-ray detectors; spectrometers
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Item ID: 30248
Depositing User: David Hall
Date Deposited: 29 Nov 2011 15:45
Last Modified: 07 Dec 2018 10:23
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