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The use of EM-CCDs on high resolution soft x-ray spectrometers

Tutt, James; Holland, Andrew; Murray, Neil; Harriss, Richard; Hall, David; Soman, Matthew; McEntaffer, Randall L. and Endicott, James (2011). The use of EM-CCDs on high resolution soft x-ray spectrometers. In: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII, 21-24 Aug 2011, San Diego.

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Charge-Coupled Devices (CCDs) have been traditionally used on high resolution soft X-ray spectrometers, but with their ability to increase the signal level in the detector before the readout noise of the system is added, Electron-Multiplying CCDs (EM-CCDs) have the potential to offer many advantages in soft X-ray detection. Through this signal multiplication an EM-CCD has advantages over conventioanl CCDs of increased signal, suppressed noise, faster readout speeds for the same equivalent readout noise and an increased inmmunity to Electro-Magnetic Intereference. This paper will look at present and future spacel applications for high resolution soft X-ray spectrometers and assess the advantages and disadvantage of using EM-CCDs in these applications.

Item Type: Conference or Workshop Item
Copyright Holders: 2011 Society of Photo-Optical Instrumentation Engineers (SPIE)
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
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Item ID: 30117
Depositing User: David Hall
Date Deposited: 17 Nov 2011 15:51
Last Modified: 23 Feb 2020 15:21
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