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Proton irradiation of swept-charge devices for theChandrayaan-1 X-ray Spectrometer (C1XS)

Smith, D. R.; Gow, J. and Holland, A. D. (2007). Proton irradiation of swept-charge devices for theChandrayaan-1 X-ray Spectrometer (C1XS). Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, A583(2&3) pp. 270–277.

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This paper presents work carried out in support of swept-charge device (SCD) characterisation for the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument. A brief overview of the C1XS instrument is presented, followed by a description of SCD structure and operation. The SCD test facility and method of device characterisation using two different drive sequencers to assess leakage current and spectroscopy performance (FWHM and noise at Mn-Kα) are then described. The expected end-of-life (EOL) 10 MeV equivalent proton fluence for the SCDs of C1XS was modelled using Monte Carlo simulation software and used in a subsequent proton irradiation study involving eight SCDs. The irradiation study was carried out at the Kernfysisch Versneller Instituut (KVI) in the Netherlands and characterised the impact of 50 % and 100 % of the expected Chandrayaan-1 EOL proton fluence on the SCD operational characteristics. The radiation environment modelling, irradiation methodology and post-irradiation characterisation of the devices are presented in this paper and recommendations about the planned C1XS operational temperature and shielding are given.

Item Type: Journal Item
Copyright Holders: 2007 Elsevier B.V.
ISSN: 0168-9002
Keywords: SCD; radiation damage; Chandrayaan-1; C1XS
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Research Group: Centre for Electronic Imaging (CEI)
Related URLs:
Item ID: 29968
Depositing User: Jason Gow
Date Deposited: 07 Nov 2011 10:56
Last Modified: 11 Jun 2020 19:25
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