Jazaeri, H. and Humphreys, F. J.
|DOI (Digital Object Identifier) Link:||http://doi.org/10.1111/j.0022-2720.2004.01296.x|
|Google Scholar:||Look up in Google Scholar|
The use of high-resolution electron backscatter diffraction in the scanning electron microscope to quantify the volume fraction of recrystallization and the recrystallization kinetics is discussed. Monitoring the changes of high-angle grain boundary (HAGB) content during annealing is shown to be a reliable method of determining the volume fraction of recrystallization during discontinuous recrystallization, where a large increase in the percentage of high-angle boundaries occurs during annealing. The results are shown to be consistent with the standard methods of studying recrystallization, such as quantitative metallography and hardness testing. Application of the method to a highly deformed material has shown that it can be used to identify the transition from discontinuous to continuous recrystallization during which there is no significant change in the percentage of HAGB during annealing.
|Item Type:||Journal Article|
|Copyright Holders:||2004 The Royal Microscopical Society|
|Keywords:||EBSD; line-scanning;mapping; quantitative metallography; recrystallization|
|Academic Unit/Department:||Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
|Depositing User:||Hedieh Jazaeri|
|Date Deposited:||18 Mar 2011 10:27|
|Last Modified:||04 Oct 2016 11:00|
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