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Using patterns in the automatic marking of ER-Diagrams

Thomas, Pete; Waugh, Kevin and Smith, Neil (2006). Using patterns in the automatic marking of ER-Diagrams. In: 11th Annual Conference on Innovation and Technology in Computer Science Education, 26-28 June 2006, Bologna, Italy.

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Abstract

This paper illustrates how the notion of pattern can be used in the automatic analysis and synthesis of diagrams, applied particularly to the automatic marking of ER-diagrams. The paper describes how diagram patterns fit into a general framework for diagram interpretation and provides examples of how patterns can be exploited in other fields. Diagram patterns are defined and specified within the area of ER-diagrams. The paper also shows how patterns are being exploited in a revision tool for understanding ER-diagrams.

Item Type: Conference Item
Keywords: Diagram interpretation; automatic grading; entity-relationship diagrams; patterns; teaching tool
Academic Unit/Department: Mathematics, Computing and Technology > Computing & Communications
Interdisciplinary Research Centre: Centre for Research in Computing (CRC)
Item ID: 2739
Depositing User: Pete Thomas
Date Deposited: 10 Jul 2006
Last Modified: 05 Dec 2010 05:44
URI: http://oro.open.ac.uk/id/eprint/2739
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