Broadhurst, A.; Rogers, K. D.; Lowe, T. W. and Lane, D. W.
(2005).
Determination of depth-dependent diffraction data: a new approach.
Acta Crystallographica Section A: Foundations of Crystallography, A61 pp. 139–146.
Abstract
A direct method for determining powder diffraction data at specific depths from angle-dependent diffraction data is described. The method is non-destructive and only traditional data collections, where the angle of incidence is varied, are required. These angle-dependent spectra are transformed to give diffraction data arising from different depths, which may then be exploited using any conventional method. This is a novel approach as traditional methods are forced to tolerate the inherent depth averaging of grazing-angle diffraction, or only examine specific structural characteristics. In order to obtain depth-dependent X-ray diffraction data, a Fredholm integral equation of the first kind is solved using regularization techniques. The method has been validated by the generation of pseudo-experimental data having known depth profiles and solving the Fredholm integral equation to recover the solution. The method has also been applied to experimental data from a number of thin film systems.
| Item Type: |
Journal Article
|
| Copyright Holders: |
2005 International Union of Crystallography |
| ISSN: |
1600-5724 |
| External Project Funding Details: |
| Funded Project Name | Project ID | Funding Body |
|---|
| Not Set | Not Set | EPSRC |
|
| Keywords: |
depth profiling; Fredholm integral equation; regularization |
| Academic Unit/Department: |
Mathematics, Computing and Technology > Mathematics and Statistics |
| Item ID: |
25905 |
| Depositing User: |
Timothy Lowe
|
| Date Deposited: |
08 Apr 2011 13:44 |
| Last Modified: |
13 Feb 2014 09:42 |
| URI: |
http://oro.open.ac.uk/id/eprint/25905 |
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