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Low energy electron attachment to condensed formic acid

Ptasinska, S.; Bass, A. D. and Sanche, L. (2008). Low energy electron attachment to condensed formic acid. Journal of Physics: Conference Series, 115(1) 012018.

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Dissociative electron attachment to formic acid in the condensed phase is studied using improved mass spectrometric detection of the negative ion fragments. The desorbed yields are measured as a function of incident electron energy in the range between 3 to 20 eV. Unlike previous work, the formation of the dehydrogenated anion HCOO? is observed and the signal to noise ratio is much higher for all other ions detected, i.e. OH?, O? and H?. Resonant structure seen in all anion yield functions, is attributed to dissociative electron attachment (DEA), whereas above 14 eV nonresonant dipolar dissociation (DD) dominates the desorption yields.

Item Type: Journal Item
Copyright Holders: 2008 IOP Publishing Ltd
ISSN: 1742-6588
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 24465
Depositing User: Tracy Bartlett
Date Deposited: 04 Nov 2010 11:48
Last Modified: 02 May 2018 13:19
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