Waugh, A.R.; Payne, S.; Worrall, G.M. and Smith, G.D.W.
(1984).
| DOI (Digital Object Identifier) Link: | https://doi.org/10.1051/jphyscol:1984934 |
|---|---|
| Google Scholar: | Look up in Google Scholar |
Abstract
A controlled ion milling procedure is described which permits a feature of interest, such as a grain boundary to be brought towards the imaging region at the apex of a field ion specimen.
| Item Type: | Article |
|---|---|
| Copyright Holders: | 1984 The Authors |
| ISSN: | 0449-1947 |
| Extra Information: | Paper presented at 31st International Field Emission Symposium / 31ème Symposium International d'Emission de Champ
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| Academic Unit/School: | Faculty of Science, Technology, Engineering and Mathematics (STEM) |
| Item ID: | 24252 |
| Depositing User: | Shirley Northover |
| Date Deposited: | 09 Mar 2011 14:47 |
| Last Modified: | 29 Nov 2016 10:08 |
| URI: | http://oro.open.ac.uk/id/eprint/24252 |
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