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Waugh, A.R.; Payne, S.; Worrall, G.M. and Smith, G.D.W.
(1984).
DOI: https://doi.org/10.1051/jphyscol:1984934
Abstract
A controlled ion milling procedure is described which permits a feature of interest, such as a grain boundary to be brought towards the imaging region at the apex of a field ion specimen.
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About
- Item ORO ID
- 24252
- Item Type
- Journal Item
- ISSN
- 0449-1947
- Extra Information
- Paper presented at 31st International Field Emission Symposium / 31ème Symposium International d'Emission de Champ
- Academic Unit or School
-
Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM) - Copyright Holders
- © 1984 The Authors
- Depositing User
- Shirley Northover