Gow, J.; Holland, A. D. and Pool, P.
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|DOI (Digital Object Identifier) Link:||https://doi.org/10.1117/12.826856|
|Google Scholar:||Look up in Google Scholar|
The first generation of Swept Charge Device (SCD) the e2v technologies plc CCD54 was used in the Demonstration of a Compact Imaging X-ray Spectrometer (D-CIXS) launched in 2003 and again in the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument currently in orbit around the Moon. The main source of decreased energy resolution in both cases is proton damage, from trapped and solar protons respectively. This paper presents the results from an experimental study to evaluate the performance of the next generation of SCD the CCD234 and CCD236 irradiated with a 10 MeV equivalent proton fluence of 3.0?108 protons.cm-2, demonstrating the factor of two increase in radiation hardness when compared to the CCD54. In particular the increased dark current, decrease in energy resolution and the degradation of charge transfer efficiency (CTE) are described.
|Item Type:||Conference Item|
|Copyright Holders:||SPIE - The International Society for Optical Engineering|
|Keywords:||swept charge device; SCD; proton radiation damage; charge transfer efficiency; displacement damage hardened;|
|Academic Unit/School:||Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
|Interdisciplinary Research Centre:||Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)|
|Depositing User:||Jason Gow|
|Date Deposited:||03 Feb 2010 14:14|
|Last Modified:||30 Nov 2016 15:57|
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