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A comparative study of proton radiation damage in p- and n-channel

Gow, J.; Murray, N. J.; Holland, A. D.; Burt, D. and Pool, P. (2009). A comparative study of proton radiation damage in p- and n-channel. In: Proceedings of SPIE: UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVI, 3 August 2009, San Diego, USA.

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It has been demonstrated that p-channel charge coupled devices (CCDs) are more radiation hard than conventional n-channel devices as they are not affected by the dominant electron trapping caused by the displacement damage defect the E-centre (phosphorus-vacancy). This paper presents a summary of the results from a comparative study of n-channel and p-channel CCDs each type operated under the same conditions. The CCD tested is the e2v technologies plc CCD47-20, a 1024 ? 1024 frame transfer device with a split output register, fabricated using the same mask to form n-channel and
p-channel devices. The p-channel devices were irradiated to a 10 MeV equivalent proton fluence of 4.07?1010 and 1.35?1011, an n-channel CCD was irradiated to a 10 MeV equivalent proton fluence of 1.68?109, however due to time constraints the n-channel device was not characterised, n-channel comparisons are instead made using a CCD02. As expected the p-channel CCD demonstrated improved radiation tolerance when compared to the n-channel CCD, at -90 ?C there is an approximate ×7 and ×15 improvement in tolerance to radiation induced parallel and serial CTI respectively for equivalent pixel geometries.

Item Type: Conference Item
Copyright Holders: SPIE - The International Society for Optical Engineering
Keywords: CCD; proton radiation damage; p-channel; n-channel; charge transfer efficiency; displacement damage hardened;
Academic Unit/Department: Science > Physical Sciences
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 19850
Depositing User: Jason Gow
Date Deposited: 03 Feb 2010 14:19
Last Modified: 29 Feb 2016 14:10
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