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The effects of protons on the performance of swept-charge devices

Smith, Dave R. and Gow, Jason (2009). The effects of protons on the performance of swept-charge devices. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 604(1-2) pp. 177–179.

DOI (Digital Object Identifier) Link: https://doi.org/10.1016/j.nima.2009.01.051
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Abstract

The e2v technologies CCD54, or swept-charge device (SCD) has been extensively radiation tested for use in the Chandrayaan-1 X-ray Spectrometer (C1XS) instrument, to be launched as a part of the Indian Space Research Organisation (ISRO) Chandrayaan-1 payload in 2008. The principle use of the SCD is in X-ray fluorescence (XRF) applications, the device providing a relatively large collecting area of 1.1 cm2, and achieving near Fano-limited spectroscopy at −15 °C, a temperature that is easily obtained using a thermoelectric cooler (TEC). This paper describes the structure and operation of the SCD and details the methodology and results obtained from two proton irradiation studies carried out in 2006 and 2008, respectively to quantify the effects of proton irradiation on the operational characteristics of the device. The analysis concentrates on the degradation of the measured FWHM of various elemental lines and quantifies the effects of proton fluence on the observed X-ray fluorescence spectra from mineralogical target samples.

Item Type: Journal Item
Copyright Holders: 2009 Elsevier B.V
ISSN: 0168-9002
Keywords: SCD; proton damage; C1XS; swept charge device;
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 19848
Depositing User: Jason Gow
Date Deposited: 03 Feb 2010 14:35
Last Modified: 07 Dec 2018 09:31
URI: http://oro.open.ac.uk/id/eprint/19848
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