Steuwer, A.; Santisteban, J. R.; Turski, M.; Withers, P. J. and Buslaps, T.
|DOI (Digital Object Identifier) Link:||http://doi.org/10.1107/S0021889804023349|
|Google Scholar:||Look up in Google Scholar|
The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data.
|Item Type:||Journal Article|
|Copyright Holders:||2004 International Union of Crystallography|
|Academic Unit/Department:||Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
|Depositing User:||Colin Smith|
|Date Deposited:||21 Dec 2009 10:33|
|Last Modified:||02 Aug 2016 13:34|
|Share this page:|