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High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data

Steuwer, A.; Santisteban, J. R.; Turski, M.; Withers, P. J. and Buslaps, T. (2004). High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data. Journal of Applied Crystallography, 37(6) pp. 883–889.

DOI (Digital Object Identifier) Link: http://dx.doi.org/10.1107/S0021889804023349
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Abstract

The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data.

Item Type: Journal Article
Copyright Holders: 2004 International Union of Crystallography
ISSN: 0021-8898
Academic Unit/Department: Mathematics, Computing and Technology > Engineering & Innovation
Item ID: 19257
Depositing User: Colin Smith
Date Deposited: 21 Dec 2009 10:33
Last Modified: 02 Dec 2010 20:42
URI: http://oro.open.ac.uk/id/eprint/19257
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