Steuwer, A.; Santisteban, J. R.; Turski, M.; Withers, P. J. and Buslaps, T.
High-resolution strain mapping in bulk samples using full-profile analysis of energy-dispersive synchrotron X-ray diffraction data.
Journal of Applied Crystallography, 37(6) pp. 883–889.
The feasibility of both high spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beamline ID15A at the ESRF. The data analysis was performed using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point uncertainty of 10-5. The measurements have been validated with complementary techniques or reference data.
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