Cicman, P.; Buchanan, G. A.; Marston, G.; Gulejová, B.; Skalný, J. D.; Mason, N. J.; Scheier , P. and Märk, T. D.
|DOI (Digital Object Identifier) Link:||https://doi.org/10.1063/1.1806822|
|Google Scholar:||Look up in Google Scholar|
Electron attachment was studied in gaseous dinitrogen pentoxide, N2O5, for incident electron energies between a few meV and 10 eV. No stable parent anion N2O was observed but several anionic fragments (NO, NO, NO–, O–, and O) were detected using quadrupole mass spectrometry. Many of these dissociative pathways were found to be coupled and provide detailed information on the dynamics of N2O5 fragmentation. Estimates of the cross sections for production of each of the anionic fragments were made and suggest that electron attachment to N2O5 is amongst the most efficient attachment reactions recorded for nonhalogenated polyatomic systems.
|Item Type:||Journal Article|
|Copyright Holders:||2004 American Institute of Physics|
|Academic Unit/School:||Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
|Interdisciplinary Research Centre:||Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)|
|Depositing User:||Colin Smith|
|Date Deposited:||21 Dec 2009 10:19|
|Last Modified:||29 Nov 2016 16:55|
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