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High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data

Steuwer, A.; Santisteban, Javier; Turski, M.; Withers, P. J. and Buslaps, T. (2005). High-resolution strain mapping in bulk samples using full-profile analysis of energy dispersive synchrotron X-ray diffraction data. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 238(1-4) pp. 200–204.

DOI (Digital Object Identifier) Link: https://doi.org/10.1016/j.nimb.2005.06.049
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Abstract

The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. An asymmetric peak profile was necessary in order to obtain a point-to-point strain uncertainty of 10(-5). The presented results have been validated with alternative methods, in this case FE model predictions. This technique promises to be a significant development in the in situ characterisation of strain fields around cracks in bulk engineering samples. The implication of slit size and grain size are discussed. This paper is a concise version of the work published in [A. Steuwer, J.R. Santisteban, M. Turski, P.J. Withers, T. Buslaps, J. Appl. Cryst. 37 (2004) 883].

Item Type: Journal Item
Copyright Holders: 2005 Elsevier B.V.
ISSN: 0168-583X
Keywords: energy dispersive; diffraction; residual stress; whole-pattern fitting
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Engineering and Innovation
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 18174
Depositing User: Colin Smith
Date Deposited: 08 Sep 2009 11:08
Last Modified: 07 Dec 2018 09:27
URI: http://oro.open.ac.uk/id/eprint/18174
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