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Application of Bryan's algorithm to the mobility spectrum analysis of semiconductor devices

Chrastina, D.; Hague, J. P. and Leadley, D. R. (2003). Application of Bryan's algorithm to the mobility spectrum analysis of semiconductor devices. Journal of Applied Physics, 94(10) pp. 6583–6590.

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A powerful method for mobility spectrum analysis is presented, based on Bryan's maximum entropy algorithm. The Bayesian analysis central to Bryan's algorithm ensures that we avoid overfitting of data, resulting in a physically reasonable solution. The algorithm is fast, and allows the analysis of large quantities of data, removing the bias of data selection inherent in all previous techniques. Existing mobility spectrum analysis systems are reviewed, and the performance of the Bryan's algorithm mobility spectrum (BAMS) approach is demonstrated using synthetic data sets. Analysis of experimental data is briefly discussed. We find that BAMS performs well compared to existing mobility spectrum methods.

Item Type: Journal Article
Copyright Holders: 2003 American Institute of Physics
ISSN: 0021-8979
Project Funding Details:
Funded Project NameProject IDFunding Body
Not SetNot SetGROWTH program ECOPRO No. GRD2-2000-30064
Extra Information: This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Academic Unit/Department: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Biomedical Research Network (BRN)
Item ID: 12280
Depositing User: James Hague
Date Deposited: 13 May 2009 15:44
Last Modified: 06 Oct 2016 05:38
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