Application of Bryan's algorithm to the mobility spectrum analysis of semiconductor devices

Chrastina, D.; Hague, J. P. and Leadley, D. R. (2003). Application of Bryan's algorithm to the mobility spectrum analysis of semiconductor devices. Journal of Applied Physics, 94(10) pp. 6583–6590.

DOI: https://doi.org/10.1063/1.1621719

Abstract

A powerful method for mobility spectrum analysis is presented, based on Bryan's maximum entropy algorithm. The Bayesian analysis central to Bryan's algorithm ensures that we avoid overfitting of data, resulting in a physically reasonable solution. The algorithm is fast, and allows the analysis of large quantities of data, removing the bias of data selection inherent in all previous techniques. Existing mobility spectrum analysis systems are reviewed, and the performance of the Bryan's algorithm mobility spectrum (BAMS) approach is demonstrated using synthetic data sets. Analysis of experimental data is briefly discussed. We find that BAMS performs well compared to existing mobility spectrum methods.

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• Item ORO ID
• 12280
• Item Type
• Journal Item
• ISSN
• 0021-8979
• Project Funding Details

• Funded Project Name	Project ID	Funding Body
  Not Set	Not Set	GROWTH program ECOPRO No. GRD2-2000-30064

• Extra Information
• This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
• Academic Unit or School
• Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
  Faculty of Science, Technology, Engineering and Mathematics (STEM)
• Research Group
• Physics
• Copyright Holders
• © 2003 American Institute of Physics
• Depositing User
• James Hague