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X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy

Ptasińska, Sylwia; Stypczynska, Agnieszka; Nixon, Tony; Mason, Nigel; Klyachko, DV and Sanche, L (2008). X-ray induced damage in DNA monitored by X-ray photoelectron spectroscopy. Journal of Chemical Physics, 129(6) pp. 129–134.

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In this work, the chemical changes in calf thymus DNA samples were analyzed by X-ray photoelectron spectroscopy XPS. The DNA samples were irradiated for over 5 h and spectra were taken repeatedly every 30 min. In this approach the X-ray beam both damages and probes the samples. In most cases, XPS spectra have complex shapes due to contributions of C, N, and O atoms bonded at several different sites. We show that from a comparative analysis of the modification in XPS line shapes of the C 1s, O 1s, N 1s, and P 2p peaks, one can gain insight into a number of
reaction pathways leading to radiation damage to DNA.

Item Type: Journal Article
Copyright Holders: 2008 American Institute of Physics
Academic Unit/Department: Science > Physical Sciences
Mathematics, Computing and Technology > Engineering & Innovation
Mathematics, Computing and Technology
Interdisciplinary Research Centre: Centre for Earth, Planetary, Space and Astronomical Research (CEPSAR)
Item ID: 11389
Depositing User: Astrid Peterkin
Date Deposited: 18 Aug 2008 12:46
Last Modified: 23 Feb 2016 21:42
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