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Coordinated isotopic and mineralogic analyses of planetary materials enabled by in situ lift-out with a focused ion beam scanning electron microscope

Zega, Thomas J.; Nittler, Larry R.; Busemann, Henner; Hoppe, Peter and Stroud, Rhonda M. (2007). Coordinated isotopic and mineralogic analyses of planetary materials enabled by in situ lift-out with a focused ion beam scanning electron microscope. Meteoritics and Planetary Science, 42(7-8) pp. 1373–1386.

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Abstract

We describe a focused ion beam scanning electron microscope (FIB-SEM) technique that enables coordinated isotopic and mineralogic analysis of planetary materials. We show that site-specific electron-transparent sections can be created and extracted in situ using a microtweezer and demonstrate that they are amenable to analysis by secondary ion mass spectrometry (SIMS), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). These methods greatly advance the ability to address several fundamental questions in meteoritics, such as accretion and alteration histories of chondrules and the origin and history of preserved nebular and presolar materials.

Item Type: Journal Item
ISSN: 1086-9379
Academic Unit/School: Faculty of Science, Technology, Engineering and Mathematics (STEM) > Physical Sciences
Faculty of Science, Technology, Engineering and Mathematics (STEM)
Item ID: 10430
Depositing User: Karen Guyler
Date Deposited: 12 Mar 2008
Last Modified: 07 Dec 2018 09:09
URI: http://oro.open.ac.uk/id/eprint/10430
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